Italia De Feis

6PUBLICATIONS
17CO-AUTHORS
Compound semiconductorsEconomic models and forecastingElectrical circuits and systemsData structures and algorithmsSatellite communications
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Journal

Publications (6)

|Aug 27, 2026
Correction: Amato et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. Sensors 2025, 25, 4218.

|Jul 12, 2025
Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production.

Umberto Amato, Anestis Antoniadis, Italia De Feis

|Sep 23, 2024
A Network-Constrain Weibull AFT Model for Biomarkers Discovery.

Claudia Angelini, Daniela De Canditiis, Italia De Feis

|Jul 29, 2023
Predictive Maintenance of Pins in the ECD Equipment for Cu Deposition in the Semiconductor Industry.

Umberto Amato, Anestis Antoniadis, Italia De Feis

|Dec 01, 2020
Exploring the Interaction between the SWI/SNF Chromatin Remodeling Complex and the Zinc Finger Factor CTCF.

Mariangela Valletta, Rosita Russo, Ilaria Baglivo

|Apr 25, 2020
Optimal Interpolation for Infrared Products from Hyperspectral Satellite Imagers and Sounders.

Italia De Feis, Guido Masiello, Angela Cersosimo

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Frequent Collaborators

3 joint publications

Daniele Pagano

3 joint publications

Antonino La Magna

3 joint publications

Umberto Amato

3 joint publications

Anestis Antoniadis