Italia De Feis
5PUBLICATIONS
17CO-AUTHORS
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Publications (5)
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|Jul 12, 2025
Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production.Umberto Amato, Anestis Antoniadis, Italia De Feis
|Sep 23, 2024
A Network-Constrain Weibull AFT Model for Biomarkers Discovery.Claudia Angelini, Daniela De Canditiis, Italia De Feis
|Jul 29, 2023
Predictive Maintenance of Pins in the ECD Equipment for Cu Deposition in the Semiconductor Industry.Umberto Amato, Anestis Antoniadis, Italia De Feis
|Dec 01, 2020
Exploring the Interaction between the SWI/SNF Chromatin Remodeling Complex and the Zinc Finger Factor CTCF.Mariangela Valletta, Rosita Russo, Ilaria Baglivo
|Apr 25, 2020
Optimal Interpolation for Infrared Products from Hyperspectral Satellite Imagers and Sounders.Italia De Feis, Guido Masiello, Angela Cersosimo
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Frequent Collaborators
2 joint publications
Daniele Pagano
2 joint publications
Claudia Angelini
2 joint publications
Antonino La Magna
2 joint publications
Umberto Amato
2 joint publications
Anestis Antoniadis
2 joint publications
Irène Gijbels
1 joint publications
Guido Masiello
1 joint publications
Rosita Russo
1 joint publications
Ilaria Baglivo
1 joint publications
Easter Selvan Suviseshamuthu
