Umberto Amato
3PUBLICATIONS
8CO-AUTHORS
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Publications (3)
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|Jul 12, 2025
Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production.Umberto Amato, Anestis Antoniadis, Italia De Feis
|Jul 29, 2023
Predictive Maintenance of Pins in the ECD Equipment for Cu Deposition in the Semiconductor Industry.Umberto Amato, Anestis Antoniadis, Italia De Feis
|Apr 12, 2020
Cloud Detection: An Assessment Study from the ESA Round Robin Exercise for PROBA-V.Umberto Amato, Anestis Antoniadis, Maria Francesca Carfora
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Frequent Collaborators
2 joint publications
Anestis Antoniadis
2 joint publications
Italia De Feis
2 joint publications
Irène Gijbels
2 joint publications
Antonino La Magna
2 joint publications
Daniele Pagano
1 joint publications
Maria Francesca Carfora
1 joint publications
Donatella Granata
1 joint publications
Easter Selvan Suviseshamuthu
