Irène Gijbels

5PUBLICATIONS
9CO-AUTHORS
Compound semiconductorsEpidemiological modellingElectrical circuits and systemsTime series and spatial modelling
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Publications (5)

|Aug 27, 2026
Correction: Amato et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. Sensors 2025, 25, 4218.

|Jul 12, 2025
Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production.

Umberto Amato, Anestis Antoniadis, Italia De Feis

|Apr 29, 2025
A hybrid hazard-based model using two-piece distributions.

Worku Biyadgie Ewnetu, Irène Gijbels, Anneleen Verhasselt

|Jul 29, 2023
Predictive Maintenance of Pins in the ECD Equipment for Cu Deposition in the Semiconductor Industry.

Umberto Amato, Anestis Antoniadis, Italia De Feis

|Dec 08, 2020
Multivariate Tail Coefficients: Properties and Estimation.

Irène Gijbels, Vojtěch Kika, Marek Omelka

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Frequent Collaborators

3 joint publications

Umberto Amato

3 joint publications

Anestis Antoniadis

3 joint publications

Italia De Feis

3 joint publications

Antonino La Magna