Irène Gijbels
4PUBLICATIONS
9CO-AUTHORS
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Publications (4)
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|Jul 12, 2025
Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production.Umberto Amato, Anestis Antoniadis, Italia De Feis
|Apr 29, 2025
A hybrid hazard-based model using two-piece distributions.Worku Biyadgie Ewnetu, Irène Gijbels, Anneleen Verhasselt
|Jul 29, 2023
Predictive Maintenance of Pins in the ECD Equipment for Cu Deposition in the Semiconductor Industry.Umberto Amato, Anestis Antoniadis, Italia De Feis
|Dec 08, 2020
Multivariate Tail Coefficients: Properties and Estimation.Irène Gijbels, Vojtěch Kika, Marek Omelka
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Frequent Collaborators
2 joint publications
Umberto Amato
2 joint publications
Anestis Antoniadis
2 joint publications
Italia De Feis
2 joint publications
Antonino La Magna
2 joint publications
Daniele Pagano
1 joint publications
Vojtěch Kika
1 joint publications
Marek Omelka
1 joint publications
Donatella Granata
1 joint publications
Easter Selvan Suviseshamuthu
