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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Photon statistics and speckle visibility spectroscopy with partially coherent X-rays
Luxi Li1, Paweł Kwaśniewski2, Davide Orsi3
1Photon Sciences Directorate, Brookhaven National Laboratory, Upton, NY 11973, USA.
Journal of Synchrotron Radiation
|October 25, 2014
Summary
This study introduces a novel method for material dynamics measurement using X-ray scattering patterns. The technique analyzes speckle visibility in single patterns, offering a practical alternative to traditional X-ray photon correlation spectroscopy.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Photonics
Background:
- Coherent X-ray scattering is a standard technique for measuring material dynamics.
- X-ray photon correlation spectroscopy (XPCS) is widely used but has limitations in certain experimental scenarios.
- Existing methods often require extensive data acquisition (movies) and high-brightness synchrotron sources.
Purpose of the Study:
- To develop a new approach for measuring structural dynamics in materials.
- To utilize multi-speckle scattering patterns from partially coherent X-rays.
- To provide an alternative to XPCS that is more adaptable to various experimental conditions.
Main Methods:
- Analysis of photon statistics in single scattering patterns.
- Calculation of speckle contrast (speckle visibility) from these patterns.
- Application of visible-light speckle visibility spectroscopy principles to X-ray scattering.
Main Results:
- Demonstrated a new method for extracting dynamic information from single X-ray scattering patterns.
- Successfully measured Brownian dynamics in a colloidal suspension.
- Achieved excellent agreement between the new method and traditional XPCS.
Conclusions:
- The proposed method offers a practical and effective way to measure material dynamics.
- Speckle visibility analysis provides a valuable alternative to XPCS, especially when movie-mode acquisition is not feasible.
- This technique broadens the applicability of X-ray scattering for studying dynamic processes in materials.
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