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Atomic Force Microscopy

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Related Experiment Video

Updated: Apr 21, 2026

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Correcting for surface topography in X-ray fluorescence imaging.

E C Geil¹, R E Thorne¹

¹Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853, USA.

Journal of Synchrotron Radiation

|October 25, 2014

Summary

Surface topography complicates X-ray fluorescence imaging. This study derives approximations and a correction procedure to accurately analyze trace elements in samples with non-planar surfaces, improving imaging analysis.

Keywords:

X-ray fluorescence imaging surface angle surface orientation topography

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Last Updated: Apr 21, 2026

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Quantifying X-Ray Fluorescence Data Using MAPS

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Published on: February 17, 2018

Extracting Metrics for Three-dimensional Root Systems: Volume and Surface Analysis from In-soil X-ray Computed Tomography Data

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Published on: April 26, 2016

Area of Science:

Geochemistry
Materials Science
Analytical Chemistry

Background:

X-ray fluorescence (XRF) imaging is a powerful analytical technique.
Non-planar sample surfaces introduce significant challenges in XRF imaging analysis.
Surface topography can modulate fluorescence signals, leading to inaccurate quantitative results.

Purpose of the Study:

To develop approximations for understanding fluorescence signal modulation by surface angles and topography.
To propose methods for reducing the impact of surface topography on XRF signals.
To create a correction procedure for accurate trace element analysis in non-planar samples.

Main Methods:

Derivation of mathematical approximations to model the effect of surface geometry on fluorescence intensity.
Development of a correction algorithm based on a single fluorescence map.
Application of the developed correction procedure to real-world XRF data from a gypsum tablet.

Main Results:

The derived approximations effectively describe the influence of surface angles and topography on XRF signals.
The developed correction procedure demonstrates effectiveness in trace element analysis for uniform matrix samples.
Successful application of the method to an incised gypsum tablet, validating its practical utility.

Conclusions:

The developed method offers a viable solution for accurate XRF imaging of samples with complex surface topographies.
This approach enhances the reliability of quantitative trace element analysis in materials science and geochemistry.
The technique requires only a single fluorescence map, making it accessible for various applications.