X-ray STM: Nanoscale elemental analysis & Observation of atomic track

Area of Science:

• Surface Science
• Atomic Physics
• Materials Science

Background:

• Scanning tunneling microscopy (STM) offers atomic-scale surface analysis.
• Synchrotron radiation (SR) provides high-intensity X-rays for advanced microscopy.
• Elemental analysis at the atomic scale is crucial for understanding surface phenomena.

Purpose of the Study:

• To develop and apply a SR-STM system for elemental analysis at the atomic scale.
• To investigate X-ray-induced atomic motion with atomic resolution.
• To demonstrate the capabilities of SR-STM for surface characterization and reaction studies.

Main Methods:

• Combined STM with high-brilliance SR for elemental analysis.
• Developed a specialized SR-STM system and smart tip.
• Focused high-photon density X-rays onto sample surfaces.
• Observed elemental contrast and X-ray-induced atomic motion tracks.

Main Results:

• Achieved atomic-scale elemental contrast on semiconductor and metal-semiconductor interfaces.
• Resolved elemental contrast between Co nano-islands and Au substrate.
• Demonstrated spatial resolution of approximately 1 nm or less.
• Directly visualized X-ray-induced atomic motion tracks with atomic scale resolution.
• Observed local chain distribution of atomic motion, differing from 2D domain observations.

Conclusions:

• SR-STM enables atomic-scale elemental analysis and the study of X-ray-induced atomic motion.
• The method shows generality across different material interfaces.
• Results provide insights into contrast mechanisms and atomic motion dynamics.
• SR-STM holds promise for chemical analysis and control of local reactions with high spatial resolution.