High energy-resolution electron energy-loss spectroscopy study of the dielectric properties of multi-shell...

Nanoparticles, which have multi-shell structure, are expected to be stable and high efficient for the light-emitting devices. The efficiency of luminescence is considered to be affected by the multi-shell structure. In order to understand the mechanism of high efficiency luminescence, it is necessary to evaluate the multi-shell structure and dielectric properties from each particle. High energy-resolution electron energy-loss spectroscopy (HR-EELS) based on TEM is a powerful tool for this purpose. By comparing between the experimental and the simulated results, it is possible to evaluate the effect of the size and physical property of each shell material on the dielectric properties of multi-shell nanoparticles. In this study, simulations of EELS spectra of multi-shell nanoparticle (core: CdSe, inner shell: CdS, outer shell: ZnS) and mono-shell nanoparticle (core: CdSe, shell: CdS) were conducted by the dielectric continuum theory[1].Figure 1 shows calculated EELS spectra of multi and mono shell nanoparticles. The spectra are calculated from dielectric functions of single CdSe, CdS and ZnS crystals, which were experimentally derived from HR-EELS spectra by using Kramers-Kronig analysis. The radius of 6.9 nm for the nanoparticle in the simulation corresponds to the average size of actual synthesized nanoparticles. Energy positions of arrows in the inset correspond to band gap energies of CdSe, CdS and ZnS[2]. In the spectrum of multi-shell nanoparticle, the intensity corresponding to interband transition near band gap of CdSe is suppressed comparing with that of the mono shell nanoparticle. This result indicates that ZnS outer shell affects the intensity profile of EELS spectrum near band gap. This effect should be sensitive for the thickness of the shells. Thus, there is a possibility that the effect of size and thickness of each core and shell on dielectric properties of multi-shell nanoparticles could be evaluated by using HR-EELS technique.jmicro;63/suppl_1/i18/DFU039F1F1DFU039F1Fig. 1.Calculated EELS spectra.