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Real-time continuous-wave terahertz line scanner based on a compact 1 × 240 InGaAs Schottky barrier diode array
Optics Express
|November 18, 2014
Summary
This study presents a real-time terahertz (THz) imaging system using an InGaAs Schottky barrier diode (SBD) array detector. The system successfully detects foreign objects, like a paper clip under a cracker, with high spatial resolution.
Area of Science:
- Physics
- Engineering
- Materials Science
Background:
- Terahertz (THz) imaging offers non-ionizing radiation for material analysis.
- Real-time imaging systems are crucial for practical applications like quality control and security screening.
- Schottky barrier diode (SBD) array detectors provide sensitive detection in the THz range.
Purpose of the Study:
- To demonstrate a real-time continuous-wave terahertz (THz) line-scanned imaging system.
- To evaluate the system's capability for detecting foreign substances with high spatial resolution.
- To improve the signal-to-noise ratio of the detector through enhanced source beam quality.
Main Methods:
- Utilized a 1 × 240 InGaAs Schottky barrier diode (SBD) array detector.
- Employed a 200-GHz gyrotron as the THz source.
- Integrated a conveyor system and optical components including a high-density polyethylene lens, metal mirror, and THz wire-grid polarizer.
- Achieved a scan velocity of 25 cm/s and a pixel size of 0.5 × 0.5 mm².
Main Results:
- Demonstrated clear detection of foreign substances, such as a paper clip hidden under a cracker.
- Achieved a spatial resolution of approximately 1 mm.
- Showcased real-time continuous-wave THz line-scanned imaging with a scan line length of 12 cm.
- Improved the signal-to-noise ratio of the SBD array detector by enhancing source beam quality using a THz polarizer.
Conclusions:
- The developed THz line-scanning system enables effective real-time imaging and detection of concealed foreign materials.
- The integration of an InGaAs SBD array detector and optimized optical components leads to high-resolution imaging.
- This technology holds promise for various applications requiring non-destructive inspection and material characterization.

