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Signal evaluations using singular value decomposition for Thomson scattering diagnostics.

H Tojo1, I Yamada2, R Yasuhara2

  • 1Japan Atomic Energy Agency, 801-1 Mukoyama, Naka 311-0193, Japan.

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|November 29, 2014
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Summary
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This study introduces singular value decomposition to improve signal evaluation in Thomson scattering plasma diagnostics. This novel method enhances electron temperature measurement accuracy, outperforming traditional filtering techniques.

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Area of Science:

  • Plasma Physics
  • Spectroscopy
  • Data Analysis

Background:

  • Incoherent Thomson scattering is crucial for plasma diagnostics.
  • Evaluating signal intensities can be challenging due to noise and stray light.
  • Existing methods may not sufficiently mitigate interference.

Purpose of the Study:

  • To develop a novel method for evaluating signal intensities in Thomson scattering diagnostics.
  • To assess the effectiveness of singular value decomposition in noisy data.
  • To improve the accuracy of electron temperature (Te) measurements.

Main Methods:

  • Utilized a double-pass Thomson scattering system.
  • Applied singular value decomposition (SVD) to analyze scattering data.
  • Compared SVD results with low-pass filtering (<20 MHz) and unfiltered data.

Main Results:

  • Singular value decomposition effectively processed Thomson scattering data with significant noise.
  • The SVD method demonstrated superior average accuracy for measured electron temperature (Te).
  • Accuracy improvements were noted compared to low-pass filtering and unfiltered approaches.

Conclusions:

  • Singular value decomposition offers a robust method for signal evaluation in noisy Thomson scattering data.
  • This technique enhances the reliability and accuracy of electron temperature measurements.
  • SVD presents a viable alternative to conventional filtering methods for plasma diagnostics.