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Updated: Apr 20, 2026
Author Spotlight: A Stable Phantom Material for Optical and Acoustic Imaging
Published on: June 16, 2023
Simultaneously measuring thickness, density, velocity and attenuation of thin layers using V(z,t) data from
Jian Chen1, Xiaolong Bai2, Keji Yang2
1The State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou 310027, People's Republic of China; Centre for Optical and Electromagnetic Research, Zhejiang Provincial Key Laboratory for Sensing Technologies, State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310058, China.
This study introduces a new ultrasonic testing method for efficiently and automatically characterizing thin layers. The technique simultaneously measures thickness, density, sound velocity, and attenuation using time-resolved acoustic microscopy data.
Area of Science:
- Materials Science
- Acoustics
- Non-destructive Testing
Background:
- Characterizing thin layers requires efficient, comprehensive, and automated methods.
- Traditional methods can be complex and time-consuming.
Purpose of the Study:
- To develop a nondestructive ultrasonic testing method for simultaneous characterization of thin layer properties.
- To enable efficient and automated measurement of thickness, density, sound velocity, and attenuation.
Main Methods:
- Utilized time-resolved acoustic microscopy to record V(z,t) data.
- Established a theoretical reflection spectrum for thin layers at normal incidence.
- Employed an inverse algorithm with least squares fitting to determine material properties from measured spectra.
Main Results:
- Successfully demonstrated simultaneous measurement of thickness, density, sound velocity, and attenuation in a single acquisition.
- Achieved satisfactory results for a thin plate immersed in water.
- The method simplifies apparatus and procedures, enhancing efficiency and automation.
Conclusions:
- The proposed ultrasonic method offers an efficient and automated approach for comprehensive thin layer characterization.
- This technique significantly improves the measurement process for basic mechanical and geometrical properties of thin layers.
