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Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic

Timothy J Pennycook1, Andrew R Lupini2, Hao Yang3

  • 1EPSRC SuperSTEM Facility, Daresbury Laboratory, Warrington WA4 4AD, UK; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK.

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|December 3, 2014
PubMed
Summary

We developed a high-efficiency phase contrast imaging method using ptychography and pixelated detectors in aberration-corrected scanning transmission electron microscopy (STEM). This technique yields clearer images than traditional methods, even for challenging samples like graphene.

Keywords:
ABFChromatic aberrationsDPCPhase contrastPixelated detectorsPtycographySTEM

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Area of Science:

  • Electron Microscopy
  • Materials Science
  • Optics

Background:

  • Aberration correction is crucial for high-resolution imaging in scanning transmission electron microscopy (STEM).
  • Ptychography offers super-resolution and numerical aberration correction, but its application with hardware-corrected STEM and pixelated detectors is underexplored.

Purpose of the Study:

  • To demonstrate a high-efficiency phase contrast imaging method in aberration-corrected STEM using pixelated detector data and ptychography.
  • To utilize the full Fourier space information from pixelated detector datasets for enhanced imaging.
  • To explore the diagnostic capabilities of ptychography for aberrations like chromatic aberration.

Main Methods:

  • Utilizing a pixelated detector to record Ronchigrams across various probe positions in an aberration-corrected STEM.
  • Applying ptychography to analyze the recorded Ronchigram dataset.
  • Leveraging hardware aberration correction while employing ptychography to maximize Fourier space utilization for phase contrast imaging.

Main Results:

  • The developed high-efficiency ptychography method produced significantly clearer phase contrast images compared to conventional techniques.
  • Ptychography was successfully used to diagnose chromatic aberration effects.
  • Comparison of different bright-field detector configurations on bilayer graphene revealed limitations of annular bright-field imaging with aberration-corrected probes.

Conclusions:

  • High-efficiency ptychography with pixelated detectors offers superior phase contrast imaging in aberration-corrected STEM.
  • This method effectively utilizes the rich information within the four-dimensional dataset for advanced imaging and aberration analysis.
  • The findings highlight the limitations of standard bright-field detectors for certain imaging conditions in advanced STEM setups.