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The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron

Nestor J Zaluzec1

  • 1Electron Microscopy Center, Nanoscience and Technology Division, Argonne National Laboratory, Argonne, IL 60439, United States.

Ultramicroscopy
|December 16, 2014
PubMed

Keywords:
AEMAberration correctionAmplitude contrastEELSEFTEMETEMHREMIn-situPhase contrastTomographyXEDS

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