Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Nestor J Zaluzec

Showing results (1-10 of 41) with videos related to

Pageof 5
Sort By:
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 23, 2016
Theoretical and Experimental X-Ray Peak/Background Ratios and Implications for Energy-Dispersive Spectrometry in the Next-Generation Analytical Electron MicroscopeNestor J Zaluzec
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 23, 2014
Analytical formulae for calculation of X-ray detector solid angles in the scanning and scanning/transmission analytical electron microscopeNestor J Zaluzec
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 17, 2009
Detector solid angle formulas for use in X-ray energy dispersive spectrometryNestor J Zaluzec
Ultramicroscopy|December 8, 2018
Improving the sensitivity of X-ray microanalysis in the analytical electron microscopeNestor J Zaluzec
Ultramicroscopy|December 16, 2014
The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopyNestor J Zaluzec
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 10, 2022
X-ray Spectrometry in the Era of Aberration-Corrected Electron Optical Beam LinesNestor J Zaluzec
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 18, 2022
Quantitative Assessment and Measurement of X-ray Detector Performance and Solid Angle in the Analytical Electron MicroscopeNestor J Zaluzec
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 9, 2017
Practical Aspects of Electrochemical Corrosion Measurements During In Situ Analytical Transmission Electron Microscopy (TEM) of Austenitic Stainless Steel in Aqueous MediaSibylle Schilling, Arne Janssen, Nestor J Zaluzec, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 8, 2016
Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished SpecimensXiang Li Zhong, Sibylle Schilling, Nestor J Zaluzec, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 26, 2014
X-ray energy-dispersive spectrometry during in situ liquid cell studies using an analytical electron microscopeNestor J Zaluzec, M Grace Burke, Sarah J Haigh, et al.
Pageof 5

Showing results (1-10 of 41) with videos related to

Sort By:
Pageof 5
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 23, 2016
Theoretical and Experimental X-Ray Peak/Background Ratios and Implications for Energy-Dispersive Spectrometry in the Next-Generation Analytical Electron MicroscopeNestor J Zaluzec
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 23, 2014
Analytical formulae for calculation of X-ray detector solid angles in the scanning and scanning/transmission analytical electron microscopeNestor J Zaluzec
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 17, 2009
Detector solid angle formulas for use in X-ray energy dispersive spectrometryNestor J Zaluzec
Ultramicroscopy|December 8, 2018
Improving the sensitivity of X-ray microanalysis in the analytical electron microscopeNestor J Zaluzec
Ultramicroscopy|December 16, 2014
The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopyNestor J Zaluzec
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 10, 2022
X-ray Spectrometry in the Era of Aberration-Corrected Electron Optical Beam LinesNestor J Zaluzec
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 18, 2022
Quantitative Assessment and Measurement of X-ray Detector Performance and Solid Angle in the Analytical Electron MicroscopeNestor J Zaluzec
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 9, 2017
Practical Aspects of Electrochemical Corrosion Measurements During In Situ Analytical Transmission Electron Microscopy (TEM) of Austenitic Stainless Steel in Aqueous MediaSibylle Schilling, Arne Janssen, Nestor J Zaluzec, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 8, 2016
Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished SpecimensXiang Li Zhong, Sibylle Schilling, Nestor J Zaluzec, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 26, 2014
X-ray energy-dispersive spectrometry during in situ liquid cell studies using an analytical electron microscopeNestor J Zaluzec, M Grace Burke, Sarah J Haigh, et al.
Pageof 5