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Updated: Oct 3, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Quantitative Assessment and Measurement of X-ray Detector Performance and Solid Angle in the Analytical Electron

Nestor J Zaluzec1

  • 1Argonne National Laboratory, Photon Science Directorate, Argonne, IL60439, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|February 18, 2022
PubMed

Keywords:
AEMSDDSi(Li)Solid AngleXEDS

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