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Inelastic X-ray scattering with 0.75 meV resolution at 25.7 keV using a temperature-gradient analyzer

Daisuke Ishikawa1, David S Ellis1, Hiroshi Uchiyama1

  • 1Materials Dynamics Laboratory, RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Journal of Synchrotron Radiation
|December 25, 2014
PubMed

Keywords:
X-ray opticshigh-resolution analyzerinelastic X-ray scattering

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