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Programmable, very low noise current source.
G Scandurra1, G Cannatà1, G Giusi1
1Dipartimento di Ingegneria Elettronica, Chimica e Ingegneria Industriale, University of Messina, Messina 98166, Italy.
We developed a novel programmable current source for low-frequency noise measurements. This system uses a low-noise Junction Field Effect Transistor (JFET) and a floating voltage source, achieving high accuracy and minimal noise down to 100 mHz.
Area of Science:
- Electronics
- Instrumentation
- Metrology
Background:
- Accurate low-frequency noise measurements require highly stable and low-noise current sources.
- Existing programmable current sources often struggle with noise performance at very low frequencies.
Purpose of the Study:
- To develop a new programmable current source with very low noise for low-frequency noise measurements.
- To achieve high accuracy and stability in sourced current, particularly at sub-Hertz frequencies.
Main Methods:
- Utilizing a low-noise Junction Field Effect Transistor (JFET) as the core high-impedance current source.
- Implementing a programmable floating voltage source based on a photovoltaic MOSFET driver for current setting.
- Incorporating advanced filtering and a control network with super-capacitors to minimize low-frequency output noise.
Main Results:
- The developed system achieves output noise levels comparable to the intrinsic JFET noise down to 100 mHz.
- Current programmability is achieved using a standard Digital-to-Analog converter with accuracy better than 1%.
- A prototype demonstrated effective current sourcing from hundreds of microamperes to a few milliamperes, with RMS noise below 14 pA in the 0.1–10 Hz bandwidth.
Conclusions:
- The proposed approach effectively realizes a very low noise programmable current source suitable for demanding low-frequency noise measurement applications.
- The design demonstrates superior noise performance at very low frequencies, outperforming conventional methods.
- The system offers a practical solution for precise current control in sensitive electronic measurements.
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