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Quantitative evaluation of annular bright-field phase images in STEM

Takafumi Ishida1, Tadahiro Kawasaki2, Takayoshi Tanji3

  • 1Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japan takafu_i@nuee.nagoya-u.ac.jp.

Microscopy (Oxford, England)
|January 9, 2015
PubMed

Keywords:
annular apertureannular bright-field imagingmulti-channel detectorphase reconstructionscanning transmission electron microscopy

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