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Updated: Apr 18, 2026

Label-Retention Expansion Microscopy LR-ExM Enables Super-Resolution Imaging and High-Efficiency Labeling
Published on: October 11, 2022
Super-resolution in label-free photomodulated reflectivity
Omer Tzang1, Alexander Pevzner, Robert E Marvel
1School of Chemistry, The Raymond and Beverly Sackler Faculty of Exact Sciences and ‡The Center for Nanoscience and Nanotechnology, Tel Aviv University , Tel Aviv 69978, Israel.
We developed a new label-free super-resolution imaging method for nanomaterials using an ultrafast pump-probe technique. This approach achieves 105 nm resolution, surpassing the diffraction limit for advanced materials analysis.
Area of Science:
- Optics and Photonics
- Materials Science
- Nanotechnology
Background:
- Far-field super-resolution microscopy techniques are crucial for nanoscale imaging.
- Label-free methods are desirable to avoid altering sample properties.
- Existing methods often face limitations in resolution or applicability to diverse materials.
Purpose of the Study:
- To demonstrate a novel, label-free, far-field super-resolution imaging method.
- To apply this technique for enhanced imaging of nanomaterials.
- To achieve resolutions beyond the classical diffraction limit.
Main Methods:
- Utilizing an ultrafast pump-probe laser scheme.
- Exciting a diffraction-limited spatial temperature profile with a pump laser.
- Probing nonlinear changes in reflectance to reconstruct the image.
- Employing an air objective for imaging.
Main Results:
- Successfully demonstrated enhanced spatial resolution on nanofabricated silicon and vanadium dioxide nanostructures.
- Achieved a resolution of 105 nm using an air objective.
- Exceeded the diffraction limit for both pump and probe beams.
- Validated the method as a novel nanoscopy technique for materials.
Conclusions:
- The developed ultrafast pump-probe method offers a powerful new tool for label-free super-resolution imaging of nanomaterials.
- This technique provides a significant advancement in nanoscale materials characterization.
- The achieved resolution opens new avenues for studying material properties at the nanoscale.
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