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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Apr 18, 2026

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope

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Mapping of ferroelectric domain structure using angle-resolved piezoresponse force microscopy.

K L Kim¹, J E Huber¹

¹Department of Engineering Science, University of Oxford, Oxford OX1 3PJ, United Kingdom.

The Review of Scientific Instruments

|February 2, 2015

Summary

Angle-resolved piezoresponse force microscopy (AR-PFM) reveals ferroelectric domain structures in lead zirconate titanate (PZT). This technique maps non-180° domains and distinguishes between tetragonal and rhombohedral phases.

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Area of Science:

Materials Science
Condensed Matter Physics
Nanotechnology

Background:

Ferroelectric domain structures in polycrystalline materials like lead zirconate titanate (PZT) are crucial for device performance.
Understanding these structures at the nanoscale requires advanced characterization techniques.

Purpose of the Study:

To detail the methodology and application of Angle-Resolved Piezoresponse Force Microscopy (AR-PFM) for studying ferroelectric domain structures.
To investigate the ferroelectric domain patterns in polycrystalline near-morphotropic PZT.
To compare AR-PFM findings with Electron Backscatter Diffraction (EBSD) data.

Main Methods:

Angle-resolved piezoresponse force microscopy (AR-PFM) was employed to map ferroelectric domain structures.
Electron backscatter diffraction (EBSD) was used for complementary crystallographic analysis.
Image registration techniques were applied to correct for spatial distortions in scanning probe microscopy data.

Main Results:

AR-PFM successfully mapped alternating piezoresponse axes in a lamellar pattern, indicative of non-180° domain structures.
A discrepancy was observed between lateral surface displacement (AR-PFM) and in-plane polarization direction (EBSD).
AR-PFM enabled sub-grain scale phase discrimination between tetragonal and rhombohedral PZT phases.

Conclusions:

AR-PFM is a powerful tool for characterizing complex ferroelectric domain structures in PZT.
The study highlights potential discrepancies in polarization direction analysis between AR-PFM and EBSD.
AR-PFM offers high-resolution phase identification capabilities at the nanoscale.