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Updated: Apr 17, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
Aberration corrected Lorentz scanning transmission electron microscopy
S McVitie1, D McGrouther1, S McFadzean1
1Scottish Universities Physics Alliance, School of Physics and Astronomy, University of Glasgow, Glasgow, Glasgow G12 8QQ, UK.
Abstract:
We present results from an aberration corrected scanning transmission electron microscope which has been customised for high resolution quantitative Lorentz microscopy with the sample located in a magnetic field free or low field environment. We discuss the innovations in microscope instrumentation and additional hardware that underpin the imaging improvements in resolution and detection with a focus on developments in differential phase contrast microscopy. Examples from materials possessing nanometre scale variations in magnetisation illustrate the potential for aberration corrected Lorentz imaging as a tool to further our understanding of magnetism on this lengthscale.
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