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Accurate optical vector network analyzer based on optical single-sideband modulation and balanced photodetection.

Min Xue, Shilong Pan, Yongjiu Zhao

    Optics Letters
    |February 14, 2015
    PubMed
    Summary

    A new optical vector network analyzer (OVNA) eliminates measurement errors caused by high-order sidebands in optical single-sideband (OSSB) signals. This novel approach ensures accurate optical device-under-test (ODUT) responses without complex post-processing.

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    Area of Science:

    • Photonics and Optical Engineering
    • Measurement Science and Instrumentation
    • Electrical and Electronic Engineering

    Background:

    • Optical Vector Network Analyzers (OVNA) are crucial for characterizing optical systems.
    • Conventional OSSB-based OVNA methods suffer from measurement errors due to high-order sidebands.
    • Accurate characterization of optical devices requires minimizing these inherent errors.

    Purpose of the Study:

    • To propose and demonstrate a novel OVNA design that eliminates high-order sideband-induced measurement errors.
    • To achieve accurate characterization of optical devices without complex post-signal processing.
    • To validate the proposed method through experimental measurements.

    Main Methods:

    • Development of a novel OVNA architecture utilizing optical single-sideband (OSSB) modulation and balanced photodetection.
    • Implementation of a signal processing technique involving splitting the OSSB signal, removing the optical carrier in one path, and balanced photodetection.
    • Experimental validation using a fiber Bragg grating (FBG) as the optical device-under-test (ODUT).

    Main Results:

    • The proposed OVNA effectively eliminates measurement errors caused by high-order sidebands in OSSB signals.
    • Experimental results demonstrate accurate magnitude and phase responses of the FBG.
    • The method shows successful removal of high-order sideband-induced errors across different modulation indices.

    Conclusions:

    • The novel OVNA design provides an effective solution for eliminating high-order sideband-induced measurement errors.
    • This technique enables accurate and direct measurement of optical device responses.
    • The proposed method simplifies the measurement process, reducing the need for complex post-processing.