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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
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Atom-resolved analysis of an ionic KBr(001) crystal surface covered with a thin water layer by frequency modulation
Toyoko Arai1, Masashi Koshioka1, Kouhei Abe1
1†Natural Science and Technology, Kanazawa University, Kanazawa, Ishikawa 920-1192, Japan.
Langmuir : the ACS Journal of Surfaces and Colloids
|March 20, 2015
Summary
Frequency modulation atomic force microscopy (FM-AFM) achieved atomic resolution of an ionic crystal surface with a water layer. This technique enhances force detection at solid-liquid interfaces by maintaining a high cantilever Q-factor.
Area of Science:
- Surface science
- Atomic force microscopy
- Physical chemistry
Background:
- Studying solid-liquid interfaces at the atomic level is crucial for understanding chemical and physical processes.
- Atomic force microscopy (AFM) is a powerful tool for nanoscale imaging, but its performance can be limited at liquid interfaces.
- Maintaining high Q-factor in AFM cantilevers is essential for sensitive force detection.
Purpose of the Study:
- To achieve atomic resolution imaging of an ionic crystal surface covered with a thin water layer using frequency modulation atomic force microscopy (FM-AFM).
- To investigate the influence of tip-sample interactions, specifically ion adsorption and hydration layers, on AFM measurements at the solid-liquid interface.
- To analyze the force-distance characteristics at the solid-water interface with high sensitivity.
Main Methods:
- Utilized frequency modulation atomic force microscopy (FM-AFM) with atomic resolution.
- Immersed only the tip apex of the AFM cantilever in the thin water layer to maintain a high Q-factor.
- Acquired spatial variation maps of the resonant frequency shift to analyze force-distance characteristics.
- Observed two types of atom-resolved contrast images.
Main Results:
- Achieved atomic resolution imaging of the KBr(001) surface covered with a thin water layer.
- Maintained a high Q-factor for the AFM cantilever, comparable to operation in air, enabling improved differential force detection.
- Observed distinct imaging contrasts, potentially due to different ions (K+ or Br-) on the tip apex and their interaction with hydration layers.
- Demonstrated atomic site-dependent oscillatory frequency shift-distance curves at the solid-water interface.
Conclusions:
- FM-AFM with a high Q-factor is effective for atomic resolution imaging of solid-water interfaces.
- Ion adsorption on the AFM tip and sample surface, along with hydration layers, significantly influences the observed contrast and force interactions.
- The study provides insights into the fundamental interactions governing solid-liquid interfaces at the atomic scale.

