Atom-resolved analysis of an ionic KBr(001) crystal surface covered with a thin water layer by frequency modulation

Toyoko Arai1, Masashi Koshioka1, Kouhei Abe1

  • 1†Natural Science and Technology, Kanazawa University, Kanazawa, Ishikawa 920-1192, Japan.

Summary

Frequency modulation atomic force microscopy (FM-AFM) achieved atomic resolution of an ionic crystal surface with a water layer. This technique enhances force detection at solid-liquid interfaces by maintaining a high cantilever Q-factor.