Exciton mapping at subwavelength scales in two-dimensional materials

Luiz H G Tizei1, Yung-Chang Lin1, Masaki Mukai2

  • 1Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan.

Summary

Spatially resolved electron-energy-loss spectroscopy (EELS) precisely maps excitons at nanoscale interfaces between MoS2 and MoSe2 single layers. This technique enables nanometer-scale optical band gap measurements, revealing variations due to chemical composition and interface properties.

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