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Related Concept Videos

Atomic Absorption Spectroscopy: Interference01:25

Atomic Absorption Spectroscopy: Interference

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Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
Spectral interference occurs when signals from other elements or molecules overlap with the analyte signal, falsely elevating or masking the analyte's absorbance. This interference can be corrected using Zeeman,...
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Atomic Emission Spectroscopy: Interference01:30

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In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
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Atomic Absorption Spectroscopy: Instrumentation01:22

Atomic Absorption Spectroscopy: Instrumentation

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An atomic absorption spectrophotometer (AAS) comprises several components: a radiation source, an atomizer, a monochromator, and a detector. The radiation source can be a hollow-cathode lamp (HCL) or an electrodeless-discharge lamp (EDL), both of which provide a narrow emission line of the required wavelength. However, some instruments use continuum sources and high-resolution monochromators to achieve a narrow range of radiation.
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Atomic Emission Spectroscopy: Instrumentation01:22

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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Atomic Absorption Spectroscopy: Lab01:21

Atomic Absorption Spectroscopy: Lab

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For AAS measurements, samples must be introduced as clear solutions, often requiring extensive preliminary treatment to dissolve materials like soils, animal tissues, and minerals. Common methods for sample preparation include treatment with hot mineral acids, wet ashing, combustion in closed containers, high-temperature ashing, or fusion with reagents.
 Solutions containing organic solvents, such as low-molecular-mass alcohols, esters, or ketones, enhance absorbances by increasing...
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Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
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Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEM.

Hidetaka Sawada1, Naoki Shimura2, Fumio Hosokawa2

  • 1JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan hsawada@jeol.co.jp.

Microscopy (Oxford, England)
|April 1, 2015
PubMed
Summary

Researchers achieved atomic resolution, resolving 45 pm silicon-silicon atomic columns using aberration-corrected scanning transmission electron microscopy (STEM). This breakthrough in high-resolution imaging pushes the boundaries of materials science analysis.

Keywords:
Sub-50 pm resolutionaberration correctioncold field emission gunhigh-angle annular dark field imagescanning transmission electron microscope

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Electron Microscopy

Background:

  • High-resolution imaging is crucial for understanding atomic structures.
  • Achieving sub-50 picometer (pm) resolution in electron microscopy presents significant challenges.

Purpose of the Study:

  • To demonstrate the capability of resolving 45 pm silicon-silicon (Si-Si) atomic columns.
  • To validate the performance of a 300-kV aberration-corrected scanning transmission electron microscope (STEM) for ultra-high-resolution imaging.

Main Methods:

  • Utilized a 300-kV aberration-corrected STEM with a cold-field emission gun.
  • Simulated electron probe size to be sub-50 pm with a 0.4-eV energy spread.
  • Employed high-angle annular dark-field STEM imaging of a silicon specimen viewed from the [114] direction.

Main Results:

  • Successfully resolved Si-Si atomic columns with a separation of 45 pm.
  • Image simulations confirmed the probe condition's sufficiency for resolving 45 pm Si-Si dumbbells.
  • Intensity profile analysis and power spectrum confirmation validated the observed 45 pm separation.

Conclusions:

  • The study successfully demonstrated ultra-high-resolution imaging capabilities in STEM.
  • Achieved resolution of 45 pm Si-Si atomic columns, setting a new benchmark for electron microscopy.
  • The employed technique is sufficient for resolving atomic-scale features in crystalline materials.