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Low-cost Custom Fabrication and Mode-locked Operation of an All-normal-dispersion Femtosecond Fiber Laser for Multiphoton Microscopy
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Dual-comb modelocked laser.

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    This summary is machine-generated.

    This study introduces a novel semiconductor disk laser (SDL) that emits two synchronized, cross-polarized pulse trains. This breakthrough simplifies carrier-envelope-offset (CEO) frequency measurement without complex interferometers.

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    Area of Science:

    • Optics and Photonics
    • Semiconductor Lasers
    • Ultrafast Optics

    Background:

    • Semiconductor disk lasers (SDLs) are efficient light sources.
    • Generating multiple synchronized pulse trains is challenging.
    • Measuring carrier-envelope-offset (CEO) frequency typically requires complex setups.

    Purpose of the Study:

    • To demonstrate the first SDL emitting two simultaneous, collinear, cross-polarized, gigahertz modelocked pulse trains with different repetition rates.
    • To simplify the measurement of relative carrier-envelope-offset (CEO) frequency.
    • To achieve a compact and stable dual-comb laser system.

    Main Methods:

    • Utilized a modelocked integrated external-cavity surface emitting laser (MIXSEL) chip.
    • Integrated a birefringent crystal into a linear cavity to split the beam.
    • Employed a simple photodetector and microwave spectrum analyzer for frequency down-conversion.

    Main Results:

    • Achieved simultaneous emission of two collinear, overlapping, cross-polarized, gigahertz modelocked pulse trains.
    • Successfully down-converted the frequency comb difference to the microwave domain using a simple setup.
    • Demonstrated direct access to relative CEO frequency without an f-to-2f interferometer.
    • Stabilized both pulse repetition rates of the dual-comb MIXSEL with excellent noise performance.

    Conclusions:

    • The developed dual-comb MIXSEL offers a compact and efficient solution for generating multiple synchronized optical pulse trains.
    • The simplified CEO frequency measurement technique significantly reduces system complexity.
    • This technology has potential applications in spectroscopy, metrology, and optical communications.