Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

Overview of Microscopy Techniques

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Five-year survival with tebentafusp in metastatic uveal melanoma.

Annals of oncology : official journal of the European Society for Medical Oncology·2026

Same author

INVITED REVIEW: A review of dairy quality assurance programs: What do we know and where are we headed?

Journal of dairy science·2026

Same author

RT-HaND_C: A Multi-Source, Validated Real-world Head and Neck Cancer Dataset for Research.

Clinical oncology (Royal College of Radiologists (Great Britain))·2025

Same author

Individual- and Neighborhood-Level Predictors of HIV Care Continuum Progression: Clark County, Nevada.

Open forum infectious diseases·2025

Same author

Clear scalp, clear mind: Examining the beneficial impact of dandruff reduction on physical, emotional and social wellbeing.

International journal of cosmetic science·2025

Same author

Rising hospital admissions for alcohol-related cirrhosis and the impact of sex and comorbidity - a data linkage study.

Public health·2024

Same journal

Ultra-Sensitive UV Photodetectors Enabled by Built-in Electric Fields in Hierarchical NP-Type Porous Silicon.

Nanotechnology·2026

Same journal

Effect of sintering temperature on structural, microstructural and magnetic properties of La<sub>0.8</sub>Sr<sub>0.2</sub>MnO<sub>3</sub>: Evolution of faceting and terrace like morphology.

Nanotechnology·2026

Same journal

Engineered V2C MXene Anchored Cu Nanoparticles for Selective Nitrate/Nitrite Sensing and Magneto-Electrocatalytic Hydrogen Evolution Reaction.

Nanotechnology·2026

Same journal

Quantitative Mechanism Separation of Single-Event Transients in Nanosheet Transistors via TCAD Simulation.

Nanotechnology·2026

Same journal

Antibacterial, mechanical and curing properties of PMMA bone cement loaded with copper nanoparticles.

Nanotechnology·2026

Same journal

Deep learning-enabled self-powered bimodal flexible sensor for intelligent access control.

Nanotechnology·2026

See all related articles

Search research articles

Related Experiment Video

Updated: Apr 15, 2026

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

Quantitative 3D-KPFM imaging with simultaneous electrostatic force and force gradient detection.

L Collins¹, M B Okatan, Q Li

¹School of Physics, University College Dublin, Belfield, Dublin 4, Ireland. Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield, Dublin 4, Ireland.

|April 9, 2015

Summary

This summary is machine-generated.

Band excitation Kelvin probe force microscopy (BE-KPFM) overcomes signal convolution issues in traditional KPFM. This advanced technique improves lateral resolution and enables quantitative nanoscale surface potential measurements.

More Related Videos

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy

Published on: November 28, 2014

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

Related Experiment Videos

Last Updated: Apr 15, 2026

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy

Published on: November 28, 2014

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

Area of Science:

Surface science
Nanotechnology
Materials characterization

Background:

Kelvin probe force microscopy (KPFM) is vital for mapping surface potential but suffers from signal convolution.
Capacitive coupling between the probe and sample complicates accurate KPFM data interpretation.

Purpose of the Study:

To introduce and validate band excitation KPFM (BE-KPFM) for accurate surface potential measurements.
To enhance lateral resolution and enable quantitative analysis in KPFM.

Main Methods:

Utilized multifrequency band excitation (BE) to achieve dual sensitivity to electrostatic force and force gradient.
Developed a 3D-KPFM technique (Force Volume BE-KPFM) to record tip-sample distance-dependent interactions.
Demonstrated BE-KPFM on a Pt/Au/SiO(x) test structure.

Main Results:

BE-KPFM effectively negates capacitive coupling effects, unlike traditional KPFM.
Electrostatic force gradient detection in BE-KPFM significantly improved lateral resolution.
FV BE-KPFM allows for complete tip-sample capacitive de-convolution.

Conclusions:

BE-KPFM offers a robust method to overcome KPFM limitations.
The developed 3D-KPFM technique facilitates precise, quantitative surface potential mapping.
This advancement is crucial for nanoscale characterization across various materials and devices.