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Single grain boundary break junction for suspended nanogap electrodes with gapwidth down to 1-2 nm by focused ion
Ajuan Cui1, Zhe Liu2, Huanli Dong1
1Beijing National Laboratory for Molecular Sciences, Key Laboratory of Organic Solids, Institute of Chemistry, Chinese Academy of Sciences, Beijing, 100190, China.
Advanced Materials (Deerfield Beach, Fla.)
|April 10, 2015
Abstract:
Single grain boundary junctions are used for the fabrication of suspended nanogap electrodes with a gapwidth down to 1-2 nm through the break of such junctions by focused ion beam (FIB) milling. With advantages of stability and no debris, such nanogap electrodes are suitable for single molecular electronic device construction.
