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Updated: Apr 15, 2026

08:12
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
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Correction to Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS2
Nano Letters
|April 15, 2015
Abstract
No abstract available in PubMed .
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