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Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis

K Sato1, H Miyazaki2, T Gondo2

  • 1Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan ksato@imr.tohoku.ac.jp.

Microscopy (Oxford, England)
|April 24, 2015
PubMed

Keywords:
dynamic 3D observationelectron tomographyin situ deformationin situ transmission electron microscopy

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