Challenges of microtome-based serial block-face scanning electron microscopy in neuroscience

Area of Science:

• Neuroscience
• Electron Microscopy
• Computational Biology

Background:

• Serial block-face scanning electron microscopy (SBEM) is a key technique for high-resolution imaging.
• Understanding neuronal connectivity is vital for brain function research.
• Current methods struggle with the scale and complexity of neuronal microcircuits.

Purpose of the Study:

• To review recent advances in SBEM for neuronal circuit reconstruction.
• To provide an overview of image processing and analysis pipelines for SBEM data.
• To highlight SBEM's role in overcoming challenges in mapping neural connections.

Main Methods:

• Review of current literature on SBEM applications in neuroscience.
• Discussion of volume electron microscopy techniques (serial section TEM, FIB-SEM, SBEM).
• Examination of image processing and analysis workflows for large-scale EM datasets.

Main Results:

• SBEM offers sufficient resolution and field of view for dense neuronal circuit reconstruction.
• Significant progress has been made in SBEM technology and its application in neuroscience.
• Large datasets generated by SBEM necessitate advanced image processing and analysis tools.

Conclusions:

• SBEM is a powerful tool driving progress in mapping neuronal circuits.
• Continued development of SBEM and associated analysis pipelines is essential for neuroscience.
• This review provides a comprehensive overview of SBEM for circuit reconstruction and data analysis.