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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Simultaneous multiplexed materials characterization using a high-precision hard X-ray micro-slit array.

Fan Zhang1, Andrew J Allen1, Lyle E Levine1

  • 1Materials Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Stop 6520, Gaithersburg, MD 20899, USA.

Journal of Synchrotron Radiation
|May 2, 2015
PubMed
Summary
This summary is machine-generated.

A new multiplexed measurement scheme boosts experimental throughput and data quality in crystallography. This technique enables simultaneous analysis of multiple sample volumes, improving statistics and probing material heterogeneity.

Keywords:
heterogeneous structuremeasurement-in-parallelmultiplexed materials characterizationsimultaneous in operando characterizationuncertainty reduction

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Area of Science:

  • Crystallography and Materials Science
  • Advanced X-ray Scattering Techniques

Background:

  • Crystallography faces challenges in experimental throughput and in operando characterization.
  • Realistic experimental conditions require advanced methods for analyzing functional materials.

Purpose of the Study:

  • To present a novel multiplexed measurement scheme for simultaneous analysis of multiple sample volumes.
  • To enhance experimental throughput and enable direct probing of heterogeneous materials.

Main Methods:

  • Developed a multiplexed ultra-small-angle X-ray photon correlation spectroscopy (USAXS-XPCS) using photolithography-fabricated micro-slit arrays.
  • Applied the technique to study the equilibrium dynamics of a colloidal suspension.

Main Results:

  • Reduced statistical uncertainties in photon-starved USAXS-XPCS measurements below instrument resolution.
  • Demonstrated the potential for simultaneous analysis of heterogeneous sample components under identical conditions.

Conclusions:

  • The multiplexed scheme offers a new paradigm for in operando characterization of heterogeneous functional materials.
  • Applicable to various in-line synchrotron techniques, enhancing future X-ray facilities.