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Correction for specimen movement after acquisition of element-specific electron microprobe images
M K Lamvik1, P Ingram, R G Menon
1Department of Cell Biology, Duke University Medical Center, Durham, NC 27710.
Journal of Microscopy
|November 1, 1989
Summary
This study presents two new methods to correct image drift in electron beam X-ray mapping, improving resolution for elemental analysis. These techniques enhance the clarity of bone section images, revealing collagen structures previously obscured by movement.
Area of Science:
- Materials Science
- Microscopy
- Analytical Chemistry
Background:
- Electron beam X-ray mapping is crucial for elemental analysis but is limited by image resolution loss due to stage drift.
- Existing drift correction methods often require equipment modifications.
- Post-exposure correction is feasible for non-excessive drift.
Purpose of the Study:
- To develop and demonstrate non-invasive methods for correcting stage drift in X-ray maps.
- To improve image resolution and analytical accuracy in electron microscopy.
- To enable clearer visualization of microstructural features in specimens.
Main Methods:
- Developed two post-exposure image drift correction techniques.
- Method 1: Manual assignment of specimen positions for image alignment.
- Method 2: Objective image misalignment determination using cross-correlation functions.
Main Results:
- Successfully corrected image drift in a series of X-ray maps.
- Demonstrated improved resolution in calcium-specific images of a bone section.
- Revealed collagen periodicity in bone sections after drift correction, validating the methods' efficacy.
Conclusions:
- The presented methods effectively correct stage drift without equipment modification.
- These techniques enhance the quality of X-ray maps, enabling detailed microstructural analysis.
- The approach is valuable for studies requiring high-resolution elemental mapping, such as in bone research.