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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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Electrical characteristics of metal oxide based multi-layer vertical resistive switching memories

Sung Hwan Jang, Dong Hun Kim, Dong Yoel Yoon

    Journal of Nanoscience and Nanotechnology
    |May 12, 2015
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