You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Apr 12, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
1EMAT, University of Antwerp, Department of Physics, Groenenborgerlaan 171, B-2020 Antwerp, Belgium.
The MULTEM program offers fast and accurate multislice simulations for electron microscopy, enabling large-scale material analysis with reduced memory usage.
08:44Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
Published on: August 22, 2017
13:28High-resolution Single Particle Analysis from Electron Cryo-microscopy Images Using SPHIRE
Published on: May 16, 2017
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: