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The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell.
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Mid-infrared Mueller ellipsometer with pseudo-achromatic optical elements.

E Garcia-Caurel, A Lizana, G Ndong

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    A new broadband Mueller ellipsometer for mid-infrared analysis (3-14 μm) was developed. This instrument offers precise and accurate Mueller matrix measurements across a wide spectral range.

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    Area of Science:

    • Optics and Photonics
    • Materials Science
    • Spectroscopy

    Background:

    • Ellipsometry is a powerful technique for characterizing thin films and surfaces.
    • Mid-infrared spectroscopy is crucial for identifying molecular vibrations and chemical compositions.
    • Existing Mueller ellipsometers often lack broadband capabilities or achromatic performance in the mid-infrared.

    Purpose of the Study:

    • To introduce a novel broadband Mueller ellipsometer optimized for the 3-14 μm mid-infrared range.
    • To present a design that minimizes error propagation for accurate Mueller matrix determination.
    • To demonstrate the instrument's capability for both reflection and transmission measurements.

    Main Methods:

    • The instrument utilizes a polarization state generator (PSG) and polarization state analyzer (PSA) with pseudo-achromatic retarders.
    • Retardation is achieved using a V-shaped biprism employing total internal reflection.
    • The design is optimized using a criterion to minimize raw data error propagation.

    Main Results:

    • The developed Mueller ellipsometer operates effectively across the 3-14 μm spectral range.
    • Pseudo-achromatic optical elements ensure consistent measurement quality across wavelengths.
    • The instrument provides sixteen independent values for calculating the sample's Mueller matrix.

    Conclusions:

    • The new broadband Mueller ellipsometer offers a robust solution for mid-infrared optical characterization.
    • Its design ensures high precision and accuracy, suitable for diverse material analysis.
    • The instrument facilitates detailed investigation of material properties via Mueller matrix spectroscopy.