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Related Concept Videos

Determination of Crystal Structures01:29

Determination of Crystal Structures

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In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
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Related Experiment Video

Updated: Apr 12, 2026

Biochemical and Structural Characterization of the Carbohydrate Transport Substrate-binding-protein SP0092
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A multiple-common-lines method to determine the orientation of snapshot diffraction patterns from single particles.

Liang Zhou1, Tian-Yi Zhang1, Zhong-Chuan Liu1

  • 1Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Shijingshan District, Beijing, People's Republic of China.

Acta Crystallographica. Section A, Foundations and Advances
|May 14, 2015
PubMed
Summary

Researchers developed a new multiple-common-lines method to determine object orientations from X-ray diffraction data. This technique is crucial for reconstructing 3D structures of noncrystalline samples using X-ray free-electron lasers (XFELs).

Keywords:
X-ray free-electron lasers (XFELs)coherent X-ray diffraction imagingmultiple-common-lines methodsingle-particle imaging

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Area of Science:

  • Crystallography
  • Imaging Science
  • Biophysics

Background:

  • Coherent X-ray diffraction imaging (CXDI) with X-ray free-electron lasers (XFELs) enables 3D structure determination of noncrystalline specimens.
  • The 'diffract-and-destroy' mode yields numerous diffraction patterns from identical objects in random orientations.
  • Accurate orientation determination of individual objects is critical for successful 3D structure reconstruction.

Purpose of the Study:

  • To introduce a novel method for determining object orientations from snapshot diffraction patterns.
  • To address the challenge of orientation determination for both high- and low-signal diffraction data.

Main Methods:

  • Development and application of the 'multiple-common-lines' method.
  • Analysis of orientation errors for recovered high- and low-signal diffraction patterns.

Main Results:

  • The multiple-common-lines method accurately determines object orientations.
  • Mean orientation errors for high-signal patterns are approximately 0.14°, 0.06°, and 0.12° for (α, β, γ).
  • Mean orientation errors for low-signal patterns are approximately 0.77°, 0.31°, and 0.60° for (α, β, γ).

Conclusions:

  • The achieved orientation accuracy meets the stringent requirements for 3D structure reconstruction.
  • This method significantly advances the capabilities of CXDI using XFELs for structural biology and materials science.