Operational properties of fluctuation X-ray scattering data.

Erik Malmerberg1, Cheryl A Kerfeld2, Petrus H Zwart3

  • 1Physical Biosciences Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA ; Department of Plant and Microbial Biology, UC Berkeley, Berkeley, California, USA.

Iucrj
|May 22, 2015
PubMed
Summary

Fluctuation X-ray scattering (FXS) captures more information from X-ray scattering images, offering deeper structural insights into materials. This study presents FXS data properties and analysis methods for better experimental planning and data validation.

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