Detection of admittivity anomaly on high-contrast heterogeneous backgrounds using frequency difference EIT

J Jang1, J K Seo

  • 1Computational Science and Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Korea.

Summary

This study introduces a novel multiple background subtraction method for frequency difference electrical impedance tomography (fdEIT) to detect anomalies in complex backgrounds, enhancing diagnostic capabilities.

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