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Transmission Electron Microscopy

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...

Overview of Electron Microscopy

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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Electron Behavior

Electron Behavior

Overview
Electrons are negatively charged subatomic particles that are attracted to an orbit around the positively-charged nucleus of an atom. They reside in locations that are associated with energy levels called shells and are further organized into sub-shells and orbitals within each shell.
Electrons Orbit the Nucleus
Electrons are found in specific locations outside of the nucleus. The shell in which an electron resides indicates the general energy level of the electron: those closer to the...

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Related Experiment Video

Updated: Apr 11, 2026

Preparing a Celadonite Electron Source and Estimating Its Brightness

Preparing a Celadonite Electron Source and Estimating Its Brightness

Published on: November 5, 2019

Nanotube field electron emission: principles, development, and applications.

Yunhan Li¹, Yonghai Sun, J T W Yeow

¹Department of Systems Design Engineering, University of Waterloo, 200 University Ave West, Waterloo, ON, N2L 3G1, Canada.

|May 29, 2015

Summary

Carbon nanotubes (CNTs) offer superior field emission (FE) electron sources for vacuum electronics, showing great potential to replace traditional thermionic emission due to their efficiency and fast response.

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Area of Science:

Materials Science
Physics
Engineering

Background:

Field emission (FE) electron sources are increasingly used in vacuum electronic devices for their efficiency and speed.
Carbon nanotubes (CNTs) emerged as promising FE materials in the 1990s due to their unique properties.

Purpose of the Study:

To provide a comprehensive review of recent advances in CNT field emitters.
To discuss challenges and applications of CNT-based FE technology.

Main Methods:

Review of FE theories and principles.
Discussion of CNT emitter types and their performance.
Analysis of current applications and future potential.

Main Results:

CNTs exhibit high electrical and thermal conductivity, chemical stability, and high aspect ratios, making them ideal for FE.
CNT-based FE shows potential to outperform conventional thermionic emission in various applications.
Significant progress has been made in CNT FE technology over the last decade.

Conclusions:

CNT field emitters represent a significant advancement in electron source technology.
Despite remaining challenges, the development potential for CNT FE is substantial.
Further research and development are expected to drive wider adoption in vacuum electronics.