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Nanomechanics: Rocking at the nanoscale

Ignacio Wilson-Rae1

  • 1Department of Physics, University of York, York YO10 5DD, UK.

Nature Nanotechnology
|June 4, 2015
PubMed
Abstract

No abstract available in PubMed .

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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