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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

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Light emission from Ag(111) driven by inelastic tunneling in the field emission regime

Jesús Martínez-Blanco1, Stefan Fölsch

  • 1Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, 10117, Berlin, Germany.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|June 6, 2015
PubMed

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