Semiconductors
Types of Semiconductors
Graded Potential
Metal-Semiconductor Junctions
pH Scale
Biasing of Metal-Semiconductor Junctions
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Updated: Feb 15, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Yu-Chuan Lin1, Bhakti Jariwala1, Brian M Bersch1
1Department of Materials Science and Engineering, Materials Research Institute, and Center for 2D and Layered Materials (2DLM), The Pennsylvania State University , University Park, Pennsylvania 16802, United States.
Synthetically grown tungsten diselenide (WSe2) shows promise for advanced electronics. Understanding substrate interactions and defects is key to optimizing the performance of these atomically thin transition metal dichalcogenides (TMDs).
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