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Erratum: An X-ray diffractometer using mirage diffraction. Erratum

Tomoe Fukamachi1, Sukswat Jongsukswat1, Dongying Ju1

  • 1Saitama Institute of Technology , Fukaya, Saitama 369-0293, Japan.

Journal of Applied Crystallography
|June 20, 2015
PubMed

Keywords:
X-ray difractometersdynamical theory of X-ray diffractioninterference fringesmirage diffractionmirage fringesmonochromators

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