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Updated: Apr 9, 2026

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
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XTOP: high-resolution X-ray diffraction and imaging
Vincent Favre-Nicolin1, José Baruchel2, Hubert Renevier3
1Université Grenoble Alpes, INAC-SP2M, F-38000 Grenoble-Alpes, France ; CEA, INAC-SP2M, F-38000 Grenoble, France.
Abstract:
The latest virtual special issue of Journal of Applied Crystallography includes some highlights of the 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), which took place in Villard-de-Lans and Grenoble in September 2014.
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