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XTOP: high-resolution X-ray diffraction and imaging.

Vincent Favre-Nicolin1, José Baruchel2, Hubert Renevier3

  • 1Université Grenoble Alpes, INAC-SP2M, F-38000 Grenoble-Alpes, France ; CEA, INAC-SP2M, F-38000 Grenoble, France.

Journal of Applied Crystallography
|June 20, 2015
PubMed
Summary
This summary is machine-generated.

Highlights from the 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP) are featured in a special issue. This conference showcased advancements in X-ray diffraction and imaging techniques.

Keywords:
editorialhigh-resolution X-ray diffractionimaging

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Area of Science:

  • Crystallography
  • Materials Science
  • Physics

Background:

  • The 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP) convened in 2014.
  • This conference focused on cutting-edge developments in X-ray diffraction and imaging.

Purpose of the Study:

  • To disseminate key findings and advancements presented at XTOP 2014.
  • To provide a platform for researchers in high-resolution X-ray diffraction and imaging.

Main Methods:

  • Compilation of selected research highlights from the XTOP 2014 conference.
  • Publication in a special virtual issue of the Journal of Applied Crystallography.

Main Results:

  • Showcasing significant contributions to the field of high-resolution X-ray diffraction.
  • Presenting novel imaging techniques and their applications.

Conclusions:

  • The special issue serves as a valuable resource for the scientific community.
  • It reflects the state-of-the-art in X-ray diffraction and imaging as of 2014.