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Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging

M G Tsoutsouva1, V A Oliveira2, J Baruchel1

  • 1European Synchrotron Radiation Facility , 71 Avenue des Martyrs, Grenoble, F-38043, France.

Journal of Applied Crystallography
|June 20, 2015
PubMed

Keywords:
X-ray Bragg diffraction imagingdefect characterizationphotovoltaic applications

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