Local configuration pattern features for age-related macular degeneration characterization and classification

Muthu Rama Krishnan Mookiah1, U Rajendra Acharya2, Hamido Fujita3

  • 1Department of Electronics and Computer Engineering, Ngee Ann Polytechnic, Singapore 599489, Singapore.

Summary

This study introduces a new method using Linear Configuration Coefficients (LCP) and Pattern Occurrence (PO) features from fundus images for automated Age-related Macular Degeneration (AMD) diagnosis. The system achieved high accuracy, aiding clinicians in mass eye screening.

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