Separation of three-dimensional scattering effects in tilt-series Fourier ptychography

We investigate a strategy for separating the influence of three-dimensional scattering effects in tilt-series reconstruction, a method for computationally increasing the resolution of a transmission microscope with an objective lens of small numerical aperture, as occurs in the transmission electron microscope (TEM). Recent work with visible light refers to the method as Fourier ptychography. To date, reconstruction methods presume that the object is thin enough so that the beam tilt induces only a shift of the diffraction pattern in the back focal plane. In fact, it is well known that the diffraction pattern changes as a function of beam tilt when the object is thick. In this paper, we use a simple visible light model to demonstrate a proof-of-principle of a new reconstruction algorithm that can cope with this difficulty and compare it with the aperture-scanning method. Although the experiment uses a model specimen with just two distinct layers separated along the optic axis, it should in principle be extendable to continuous objects.