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Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
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Emission Spectra02:39

Emission Spectra

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When solids, liquids, or condensed gases are heated sufficiently, they radiate some of the excess energy as light. Photons produced in this manner have a range of energies, and thereby produce a continuous spectrum in which an unbroken series of wavelengths is present.
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Atomic Emission Spectroscopy: Overview01:20

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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UV–Vis Spectrometers01:14

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The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell.
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Spectrophotometry: Introduction01:16

Spectrophotometry: Introduction

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Spectrophotometry is the quantitative measurement of the absorption, reflection, diffraction, or transmission of electromagnetic radiation through a material as a function of the intensity and wavelength of the radiation. A spectrophotometer is a device used to measure the change in the radiation intensity caused by its interaction with the material.
The essential components of a spectrophotometer include a source of electromagnetic radiation, a slot for placing a material to be analyzed, and a...
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Ultraviolet and Visible (UV–Vis) Spectroscopy: Overview01:02

Ultraviolet and Visible (UV–Vis) Spectroscopy: Overview

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Ultraviolet–visible (UV–visible or UV–Vis) spectroscopy is an analytical technique that investigates the interaction between matter and UV–Vis light within the electromagnetic spectrum. This method is widely used for its versatility, simplicity, and relatively quick data acquisition, making it valuable for both qualitative and quantitative analysis. When UV–Vis radiation passes through a material,  molecules absorb light depending on the energy required for...
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ARL Spectral Fitting as an Application to Augment Spectral Data via Franck-Condon Lineshape Analysis and Color Analysis
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[An Effective Wavelength Detection Method Based on Echelle Spectra Reduction].

Lu Yin, Bayanheshig, Ji-cheng Cui

    Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu
    |June 30, 2015
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    Summary

    A new echelle spectrum reduction method improves wavelength detection speed and accuracy. This technique processes 1D spectra, correcting imaging errors for precise echelle spectrograph data analysis.

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    Area of Science:

    • Spectroscopy
    • Optical Engineering
    • Data Processing

    Context:

    • Echelle spectrometers are advanced instruments with high dispersion and resolution.
    • Two-dimensional spectra image processing is crucial for commercializing echelle spectrometers.
    • Current centroid extraction methods for wavelength detection face limitations in speed and accuracy.

    Purpose:

    • To enhance the speed, accuracy, and imaging error correction capabilities in detecting effective wavelengths for echelle spectrometers.
    • To introduce a novel method for echelle spectra image processing based on spectra reduction.

    Summary:

    • A new method converts 2D echelle spectra to a 1D image, simplifying processing and enabling simultaneous detection of all effective wavelength pixel points.
    • This approach bypasses traditional centroid extraction, improving processing efficiency and accuracy.
    • Experimental validation using a mercury lamp demonstrates significant improvements in speed and accuracy, with error correction below 0.05 mm and wavelength accuracy up to 0.02 nm.

    Impact:

    • The developed method significantly increases the operational speed of echelle spectrograph data processing.
    • It enhances the accuracy of wavelength detection, achieving high precision suitable for demanding applications.
    • The algorithm effectively compensates for imaging errors, improving the overall reliability of spectral analysis.