Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Implementation of pediatric and fetal postmortem imaging into clinical practice: a multi-society statement from the ESPR, SPR, SLARP, AOSPR, WFPI, and IAFR.

Pediatric radiology·2026

Same author

Birth-Related Subdural Haemorrhage in Asymptomatic Moderate-to-Late Preterm Neonates: Magnetic Resonance Imaging Features and Temporal Evolution.

Journal of medical imaging and radiation oncology·2026

Same author

Standardised structured foetal and neonatal postmortem magnetic resonance imaging reporting: recommendations from the European Society of Paediatric Radiology Postmortem Task Force.

Pediatric radiology·2026

Same author

Multiscale Analysis of Electrochemical Dealloying of Bimetallic Nanoparticles to Tune Catalytic Activity.

ACS applied materials & interfaces·2026

Same author

Additive Manufacturing of Nanoscale Multimaterial Voxels Via Meniscus-Confined Electrodeposition.

ACS nano·2026

Same author

Electrochemical imaging of thermochemical catalysis.

Nature catalysis·2026

Same journal

Formation of Bimetallic Nanoparticles via Exsolution Using a Reducible Metal Oxide Capping Layer.

ACS nano·2026

Same journal

Cold-Driven Thermoelectric Patch for Postoperative Tumor Control.

ACS nano·2026

Same journal

Chemically Fueled Interfacial Supramolecular Polymerization.

ACS nano·2026

Same journal

Tactile Neuromorphic Ion-Gated Vertical Transistor Displays Enabling Dual-Output Reservoir Computing.

ACS nano·2026

Same journal

In Situ Oxygen Shuttling within a Bilayer Electrified Membrane Enables Aeration-Free Electro-Fenton Water Purification.

ACS nano·2026

Same journal

Single Atoms as Growth Directors: From Graphene Edges to Atomically Precise Interfaces in 2D Materials.

ACS nano·2026

See all related articles

Search research articles

Related Experiment Video

Updated: Apr 7, 2026

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Published on: March 4, 2021

Simultaneous Nanoscale Surface Charge and Topographical Mapping.

David Perry¹, Rehab Al Botros¹, Dmitry Momotenko¹

¹†Department of Chemistry and ‡MOAC Doctoral Training Centre, University of Warwick, Coventry CV4 7AL, United Kingdom.

|July 2, 2015

Summary

This summary is machine-generated.

This study introduces a bias modulated scanning ion conductance microscopy (BM-SICM) method using nanopipettes. It enables simultaneous high-resolution mapping of surface topography and charge distribution.

Keywords:

SICM double layer finite element method modeling impedance nanopipette scanning ion conductance microscopy surface charge

More Related Videos

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM

Published on: February 10, 2021

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Related Experiment Videos

Last Updated: Apr 7, 2026

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Published on: March 4, 2021

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM

Published on: February 10, 2021

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Area of Science:

Nanoscience
Scanning Probe Microscopy
Surface Science

Background:

Nanopipettes are versatile tools in nanoscience for various applications.
Scanning ion conductance microscopy (SICM) is used for surface topography mapping.
Resolving surface charge effects simultaneously with topography is challenging.

Purpose of the Study:

To develop a method for simultaneous high-resolution mapping of topography and surface charge using nanopipettes in SICM.
To investigate the capabilities of bias modulated SICM for interfacial property analysis.

Main Methods:

Utilizing a bias modulated (BM) SICM scheme with nanopipette probes.
Employing zero net bias for topographical mapping with AC perturbation for tip positioning.
Applying net bias to render ion conductance current sensitive to surface charge.
Implementing a hopping-cyclic voltammetry mode with potential waveform application.

Main Results:

Demonstrated faithful topographical mapping alongside surface charge estimation.
Successfully probed interfacial acid-base equilibria.
Achieved high-resolution imaging of surface charge heterogeneities concurrently with topography.
Validated findings through theoretical analysis and finite element modeling.

Conclusions:

The developed BM-SICM approach effectively resolves both topography and surface charge.
This method offers powerful capabilities for detailed interfacial analysis in nanoscience.
Simultaneous mapping of topography and surface charge enhances understanding of surface phenomena.