A photoelastic measurement system for residual stress analysis in scintillating crystals by conoscopic imaging

The assessment of the stress state of scintillating crystals is an important issue for producers as well as users of such materials, because residual stress may arise during growth process. In this paper, a measurement system, based on the use of a photoelastic, conoscopic optical setup, is proposed for the assessment of stress state in scintillating crystals. Local stress values can be measured on the crystal in order to observe their spatial distribution. With the proposed system, it is possible to vary the dimensions of the inspected measurement volume. It has been validated with reference to a known stress state induced in a birefringent crystal sample and it has been tested for the case of loaded and unloaded samples, showing sub-millimetric spatial resolution and stress uncertainty ≤0.25 MPa. The proposed measurement system is a valid method for the inspection of scintillating crystals required by producers and users of such materials.